Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick-Baez microscope
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Impact Factor:6.089
Affiliation of Author(s):物理科学与工程学院
Journal:Matter and Radiation at Extremes
Place of Publication:1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
Co-author:Shengzhen Yi
Indexed by:Periodical papers
Volume:7
Issue:1
ISSN No.:2468-2047
Translation or Not:no
Date of Publication:2022-01-01
Included Journals:CNKI、SCOPUS、CSCD、WOS、EI