High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
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Impact Factor:3.992
Affiliation of Author(s):物理科学与工程学院
Journal:High Power Laser Science and Engineering
Co-author:Shengzhen Yi
Indexed by:Periodical papers
Volume:9
ISSN No.:2052-3289
Translation or Not:no
Date of Publication:2021-01-01
Included Journals:EI、CSCD、WOS、WANFANG、SCOPUS