Interfacial and microstructural evolution of Ge/C multilayers with different period thicknesses
Affiliation of Author(s):物理科学与工程学院
Journal:Materials Today Communications
Indexed by:Periodical papers
Correspondence Author:ZheZhang
Volume:51
ISSN No.:2352-4928
Translation or Not:no
Date of Publication:2026-01-01
Included Journals:CNKI、EI、SCOPUS、WOS
- Next One:[极紫外光源用大口径 Mo/Si 多层膜厚度控制与热稳定性研究]



